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LDMX Software
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All parameters describing one silicon strip sensor layer. More...
#include <SiStripDigitizer.h>
Public Attributes | |
| double | thickness {0.0} |
| Sensor thickness [mm]. Must be set from the geometry before use. | |
| double | sense_pitch {SENSE_PITCH_MM} |
| Sense (inner) electrode pitch [mm]. | |
| double | readout_pitch {READOUT_PITCH_MM} |
| Readout strip pitch [mm]. Must be an integer multiple of sense_pitch. | |
| double | bias_voltage {BIAS_VOLTAGE_V} |
| Applied reverse-bias voltage [V]. | |
| double | depletion_voltage {DEPLETION_VOLTAGE_V} |
| Full-depletion voltage [V]. | |
| double | temperature {TEMPERATURE_K} |
| Operating temperature [K]. | |
| double | noise_electrons {NOISE_ELECTRONS} |
| Electronic noise sigma [electrons ENC]. | |
| double | threshold_electrons {THRESHOLD_ELECTRONS} |
| Readout threshold [electrons]. Strips below this are suppressed. | |
| bool | is_n_type {true} |
| true = n-type bulk; false = p-type bulk. LDMX (and HPS) use n-type bulk. | |
| bool | electron_side_readout {false} |
| Simulate and read out the electron-collection side (n-strips). | |
| bool | hole_side_readout {true} |
| Simulate and read out the hole-collection side (p-strips / backplane). | |
| double | electron_lorentz_tangent {0.0} |
| tan(θ_Lorentz) for electrons. Sign encodes U-shift direction. | |
| double | hole_lorentz_tangent {0.0} |
| tan(θ_Lorentz) for holes. | |
| double | trapping {0.0} |
| Charge-trapping fraction lost per 100 µm of drift. | |
| double | deposition_granularity {0.10} |
| Adaptive segmentation granularity: max U-step as fraction of sense_pitch. | |
| int | n_segments_min {5} |
| Minimum number of track sub-segments (used when the track is close to normal incidence so the adaptive formula gives a very small count). | |
| int | n_readout_strips {N_READOUT_STRIPS} |
| Total number of readout strips. | |
| double | readout_transfer_efficiency {READOUT_TRANSFER_EFFICIENCY} |
| AC-coupling transfer efficiency from a paired sense strip (physically under a readout strip, even index within its group) to its readout strip. | |
| double | sense_transfer_efficiency {SENSE_TRANSFER_EFFICIENCY} |
| AC-coupling transfer efficiency from an unpaired sense strip (between two readout strips, odd index within its group) to each of its two adjacent readout strips. | |
All parameters describing one silicon strip sensor layer.
Definition at line 66 of file SiStripDigitizer.h.
| double tracking::digitization::SiStripDigitizer::SensorParams::bias_voltage {BIAS_VOLTAGE_V} |
Applied reverse-bias voltage [V].
Definition at line 74 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::diffusionSigma().
| double tracking::digitization::SiStripDigitizer::SensorParams::depletion_voltage {DEPLETION_VOLTAGE_V} |
Full-depletion voltage [V].
Definition at line 76 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::diffusionSigma().
| double tracking::digitization::SiStripDigitizer::SensorParams::deposition_granularity {0.10} |
Adaptive segmentation granularity: max U-step as fraction of sense_pitch.
Number of segments = max(n_segments_min, ceil(|path_length · dir_u| / (granularity · sense_pitch))).
Definition at line 102 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::adaptiveNSegments().
| double tracking::digitization::SiStripDigitizer::SensorParams::electron_lorentz_tangent {0.0} |
tan(θ_Lorentz) for electrons. Sign encodes U-shift direction.
Definition at line 92 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeStripCharges().
| bool tracking::digitization::SiStripDigitizer::SensorParams::electron_side_readout {false} |
Simulate and read out the electron-collection side (n-strips).
Definition at line 86 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeStripCharges().
| double tracking::digitization::SiStripDigitizer::SensorParams::hole_lorentz_tangent {0.0} |
tan(θ_Lorentz) for holes.
Definition at line 94 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeStripCharges().
| bool tracking::digitization::SiStripDigitizer::SensorParams::hole_side_readout {true} |
Simulate and read out the hole-collection side (p-strips / backplane).
Definition at line 88 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeStripCharges().
| bool tracking::digitization::SiStripDigitizer::SensorParams::is_n_type {true} |
true = n-type bulk; false = p-type bulk. LDMX (and HPS) use n-type bulk.
Definition at line 84 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeStripCharges().
| int tracking::digitization::SiStripDigitizer::SensorParams::n_readout_strips {N_READOUT_STRIPS} |
Total number of readout strips.
Strip index 0 is at the most-negative U edge; strip N−1 at the most-positive edge.
Definition at line 108 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::senseToReadout().
| int tracking::digitization::SiStripDigitizer::SensorParams::n_segments_min {5} |
Minimum number of track sub-segments (used when the track is close to normal incidence so the adaptive formula gives a very small count).
Definition at line 105 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::adaptiveNSegments().
| double tracking::digitization::SiStripDigitizer::SensorParams::noise_electrons {NOISE_ELECTRONS} |
Electronic noise sigma [electrons ENC].
Definition at line 80 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::applyNoiseAndThreshold().
| double tracking::digitization::SiStripDigitizer::SensorParams::readout_pitch {READOUT_PITCH_MM} |
Readout strip pitch [mm]. Must be an integer multiple of sense_pitch.
Definition at line 72 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::senseToReadout().
| double tracking::digitization::SiStripDigitizer::SensorParams::readout_transfer_efficiency {READOUT_TRANSFER_EFFICIENCY} |
AC-coupling transfer efficiency from a paired sense strip (physically under a readout strip, even index within its group) to its readout strip.
Definition at line 112 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::senseToReadout().
| double tracking::digitization::SiStripDigitizer::SensorParams::sense_pitch {SENSE_PITCH_MM} |
Sense (inner) electrode pitch [mm].
Definition at line 70 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::adaptiveNSegments(), tracking::digitization::SiStripDigitizer::computeCarrierCharges(), and tracking::digitization::SiStripDigitizer::senseToReadout().
| double tracking::digitization::SiStripDigitizer::SensorParams::sense_transfer_efficiency {SENSE_TRANSFER_EFFICIENCY} |
AC-coupling transfer efficiency from an unpaired sense strip (between two readout strips, odd index within its group) to each of its two adjacent readout strips.
Applied to both neighbours independently.
Definition at line 116 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::senseToReadout().
| double tracking::digitization::SiStripDigitizer::SensorParams::temperature {TEMPERATURE_K} |
Operating temperature [K].
Definition at line 78 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::diffusionSigma().
| double tracking::digitization::SiStripDigitizer::SensorParams::thickness {0.0} |
Sensor thickness [mm]. Must be set from the geometry before use.
Definition at line 68 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeCarrierCharges(), tracking::digitization::SiStripDigitizer::computeStripCharges(), tracking::digitization::SiStripDigitizer::diffusionSigma(), and tracking::digitization::SiStripDigitizer::setThickness().
| double tracking::digitization::SiStripDigitizer::SensorParams::threshold_electrons {THRESHOLD_ELECTRONS} |
Readout threshold [electrons]. Strips below this are suppressed.
Definition at line 82 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::applyNoiseAndThreshold().
| double tracking::digitization::SiStripDigitizer::SensorParams::trapping {0.0} |
Charge-trapping fraction lost per 100 µm of drift.
0.0 for unirradiated; ~0.2 is typical at 1×10¹⁵ n_eq/cm².
Definition at line 98 of file SiStripDigitizer.h.
Referenced by tracking::digitization::SiStripDigitizer::computeCarrierCharges().